Yoram is a Technology Director at KLA Metrology Division.

25 years in the semiconductors equipment industry, in the areas of Overlay Metrology.

Experienced with process control platforms design, for sub nanometer performance accuracy,  with immunity to environmental effects.

Intensively involved in initiating and leading large join collaborations of Israeli and European metrology firms, Academia and Research Institutes, under the IIA and the EU frameworks.

Yoram has BsC in Mechanical Engineering from the Technion, and MBA from Haifa University.

More than 50 patents in the area of process control platform and metrology solutions.